| 来源类型 | Book Section
|
| 规范类型 | 其他
|
| National Patterns of Technology Accumulation: Use of Patent Statistics. |
| Patel, Parimal; Nesta, P
|
| 发表日期 | 2004
|
| 出版者 | Kluwer Academic
|
| 出版年 | 2004
|
| 页码 | pp 531-551
|
| 语种 | 英语
|
| 摘要 | We use US Patent Statistics to depict national patterns of technology accumulation in Japan and EU countries. Two properties of country profiles are confirmed, namely, stability over time with a country and differentiation across countries. The main novelty introduced here is the combined analysis of overall technological advantage, performance in fast growing areas and impact. The results show that in many areas of technology in which EU countries have an overall relative advantage, their performance in the subfields of highest technological opportunity is weak. On the other hand, Japan seems to have a consistent level of performance both in aggregate and in fast growing areas. |
| URL | http://sro.sussex.ac.uk/id/eprint/16587/
|
| 来源智库 | Science Policy Research Unit (United Kingdom)
|
| 资源类型 | 智库出版物
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| 条目标识符 | http://119.78.100.153/handle/2XGU8XDN/466354
|
推荐引用方式
GB/T 7714 |
Patel, Parimal,Nesta, P. National Patterns of Technology Accumulation: Use of Patent Statistics.. 2004.
|
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