| 来源类型 | Discussion paper
|
| 规范类型 | 论文
|
| 来源ID | DP5307
|
| DP5307 Volatility and Development |
| Miklós Koren; Silvana Tenreyro
|
| 发表日期 | 2005-10-23
|
| 出版年 | 2005
|
| 语种 | 英语
|
| 摘要 | We analyze the duration of patent examination at the European Patent Office (EPO). Our data contain variables that are correlates of the applicants? and examiners? assessments of a patent?s economic and technical relevance as well as ex post-application citation measures which indicate the impact of the patent application on the state of the art. We present descriptive statistics for 30 major
technology fields. In our multivariate analysis we estimate competing risk specifications in order to characterize differences in the processes leading to either a withdrawal of the application by the applicant, a refusal of the patent grant or an actual patent grant by the European Patent Office. Measuring a patent?s importance relying on the number of citations by subsequent patents we find that more important patents are approved faster by the EPO than less important patents but that applicants are more hesitant to withdraw these potentially valuable applications. |
| 主题 | Industrial Organization
|
| 关键词 | Patents
Survival analysis
Patent examination
European patent office
|
| URL | https://cepr.org/publications/dp5307
|
| 来源智库 | Centre for Economic Policy Research (United Kingdom)
|
| 资源类型 | 智库出版物
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| 条目标识符 | http://119.78.100.153/handle/2XGU8XDN/534179
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推荐引用方式
GB/T 7714 |
Miklós Koren,Silvana Tenreyro. DP5307 Volatility and Development. 2005.
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