| 来源类型 | Working Paper |
| 规范类型 | 报告 |
| DOI | 10.3386/w22244 |
| 来源ID | Working Paper 22244 |
| Low-quality Patents in the Eye of the Beholder: Evidence from Multiple Examiners | |
| Gaétan de Rassenfosse; William E. Griffiths; Adam B. Jaffe; Elizabeth Webster | |
| 发表日期 | 2016-05-16 |
| 出版年 | 2016 |
| 语种 | 英语 |
| 摘要 | A low-quality patent system threatens to slow the pace of technological progress. Concerns about low patent quality are supported by estimates from litigation studies suggesting that the majority of patents granted by the U.S. patent office should not have been issued. This paper proposes a new Bayesian method for measuring patent quality, based on twin patent applications granted at one office but refused at another office. Our method allows us to distinguish whether low-quality patents are issued because an office implements a (consistently) low standard, or because it violates its own standard. The results suggest that quality in patent systems is higher than previously thought. In particular, relative to the own standard of each office, the percentage of mistakenly granted patents is under 10 percent for all offices. The Japanese patent office has a greater percentage of mistakenly granted patents than those of Europe, the United States, Korea and China, largely because it has a higher standard. |
| 主题 | Other ; Law and Economics ; Industrial Organization ; Antitrust ; Development and Growth ; Innovation and R& ; D |
| URL | https://www.nber.org/papers/w22244 |
| 来源智库 | National Bureau of Economic Research (United States) |
| 引用统计 | |
| 资源类型 | 智库出版物 |
| 条目标识符 | http://119.78.100.153/handle/2XGU8XDN/579918 |
| 推荐引用方式 GB/T 7714 | Gaétan de Rassenfosse,William E. Griffiths,Adam B. Jaffe,et al. Low-quality Patents in the Eye of the Beholder: Evidence from Multiple Examiners. 2016. |
| 条目包含的文件 | ||||||
| 文件名称/大小 | 资源类型 | 版本类型 | 开放类型 | 使用许可 | ||
| w22244.pdf（384KB） | 智库出版物 | 限制开放 | CC BY-NC-SA | 浏览 | ||
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